WITec, a manufacturer of Optical and Scanning Probe Microscopy solutions, has introduced the WITec Project Plus software package for data evaluation and chemometric image processing. It features various tools for multivariate data analysis in the fields of Confocal Raman Imaging and Scanning Probe Microscopy, such as cluster analysis and principal component analysis. Hidden structures in the images can be visualized automatically, leading to a quick and consistent interpretation of the data. Additionally, a variety of analysis tools and algorithms enable comprehensive and user-friendly computerized data evaluation and image generation. WITec Project Plus can be obtained as an add-on software package for the WITec Project data evaluation software.

In Confocal Raman Imaging, a complete Raman Spectrum is acquired at each image pixel, resulting in images consisting of tens of thousands of spectra. The WITec microscope series allows the combination of Raman imaging with Atomic Force Microscopy for a more comprehensive investigation of a sample. WITec Control for instrument and measurement control and the WITec Project package provide a software environment from one source for the various microscopic techniques, measurement modes and microscope models.